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Electron Microscopy Sciences

EMS Academy Applications

X-Ray Microanalysis Workshoparrow13The X-Ray Microanalysis Workshop: A Complete Picture

This course covers qualitative and semi quantitative analysis beginning with the generation of background and characteristic of x-rays, nomenclature, and peak family ratios. Sign Up

Targeted Participants

Individuals who are, or soon will be, expected to operate an SEM, choose appropriate parameters for EDS, and perform qualitative and semi quantitative analysis on materials samples.

Details

Wednesday - Friday
September 13 - 15, 2017
8:00 a.m. - 4:30 p.m.
Hatfield, Pennsylvania, USA

Facility

The EMS Microscopy Academy
Located in Hatfield, Pennsylvania, the Academy provides electron microscopy classes, workshops and training sessions for all fields of microscopy, including materials science and biological science.

Scope of Class

The nondestructive elemental identification of a sample’s micro-composition is a powerful tool for the microscopist. This technique can detect elements from boron to uranium with a minimum concentration delectability of 1000 ppm in solid samples.

Collection parameter settings of both the EDS system and microscope, their effect on the spectrum and quality of the subsequent quantification are of primary importance. The non-variable parameters of working distance and tilt will be demonstrated as well as the effect of accelerating voltage on background shape, x-ray spatial resolution, over-voltage requirements, and accuracy of ZAF matrix corrections examined. With the advent of the silicon drift detector (SDD) the pulse processor time constant and beam current (spot size) settings to control % dead time are almost a moot point but will be introduced for those who work with a SiLi detector.

Identification of individual elemental lines as well as methods used for determining peak overlaps such as peak shape, peak family ratio anomalies, and the presence of a peak unassociated with known elements will be paid particular attention.

Quantitative analysis will be limited to the use of ZAF and PhiRhoZ routines but the collection of standards and their use in a full quant will be discussed. Backscattered (BSE) imaging will be correlated with x-ray maps and spectral imaging results. Energy calibrations will also be preformed.

Format

Lecture, demonstration and hands-on practice, as well as round table discussion. Participants are encouraged to bring their own samples, if possible.

Main Curriculum

  • Generation and nomenclature of x-ray lines
  • Spectral artifacts
  • Deconvolution of peak overlaps
  • Qualitative analysis
  • Semi quantitative analysis
  • Hardware settings/function
  • Setup and operation of SEM for BSE imaging and spectral acquisitions
  • Sample requirements for BSE/EDS

Equipment

Hitachi S3500 SEM Bruker Esprit

Faculty

Michael Kostrna
Michael was the program director of the Electron Microscopy Technician program at Madison Area Technical College and has more than 35 years in EM technical education and research experience. He has been training EM students for 29 years and has developed curricula and lab exercises for TEM, SEM, OLM, lab safety, introductory and advanced biological EM, EM, maintenance, and x-Ray microanalysis. He has worked with companies such as SC Johnson Polymer, Dow Chemicals, Io Genetics, Virent Technologies, ABS Global, NanoOnocology, and Microscopy Inovations, and in the process gained insight to the various applications of EM.

Al Coritz
Al has been doing Electron Microscopy for 38 years, beginning at the Yale School of Medicine and ending up on the commercial side with several key EM companies. His specialty is Cryo-techniques and Thin Film Technology: i.e. Freeze Fracture/Rotary Shadowing, High Pressure Freezing, and more. He is currently with Electron Microscopy Sciences where he has been the Technical Director for over 20 years.

Schedule

Wednesday, September 13, 2017
8:00-8:30 Introduction of staff and participants
8:30-10:30 X-ray generation, nomenclature, and peak identification
10:30-11:00 Break
11:00-12:30 FWHM, peak overlaps, and qualitative analysis
12:30-1:30 Hosted lunch
1:30-3:00 Demonstration of SEM operation and EDS acquisition
3:00-4:30 EDS software setup and qualitative analysis
6:00 Dinner

Thursday, September 14, 2017
8:00-8:30 Round table discussion of previous day's activities
8:30-10:00 SEM parameters affecting spectral acquisition
10:00-10:30 Break
10:30-12:00 Demonstration of overvoltage and other collection requirements
12:00-1:00 Hosted lunch
1:00-3:00 Group A hands-on EDS operation, acquisition, and spectral analysis
  Group B sample preparation for accurate quantification
3:00-4:30 Group A sample preparation for accurate quantification
  Group B hands-on EDS operation, acquisition, and spectral analysis

Friday, September 15, 2017
8:00-8:30 Roundtable discussion of previous day's activities
8:30-10:00 Semi quantitative analysis, ZAF and Phi Rho Z
10:00-10:30 Break
10:30-12:00 Demonstration and hands-on semi quantitative analysis
12:00-1:00 Hosted lunch
1:30-4:30 BSE / spectral map / line scan acquisition

Lodging

Participants are responsible for making their own hotel reservations. The following hotel has been designated as the host hotel:

Homewood Suites
1200 Pennbrook Parkway
Lansdale, PA 19446
Phone: 215-362-6400

The special rates are $119.00 per night (plus tax) which includes a hot breakfast and a light dinner in the evening.

Please make your reservations and mention you are participating in the EMS Workshop.
GROUP CODE: EMS WORKSHOP

Everyone should plan to arrive the evening of September 12th.

Enrollment Note

Registration will be limited to a maximum of 15 participants.
EMS will provide samples to those who prefer not to bring their own.

Registration Fee $995.00

Includes

A workshop syllabus, all supplies, reagents and solutions, lunches, coffee, tea, and dinner on the first evening of the workshop.

Online Registration

Add your registration to your cart using the links below to use our secure checkout and pay by credit card.

During checkout please indicate:

  • The name of the course
  • Will you bring your own specimens? Yes / No
  • What samples you are bringing and are most interested in?

Checkout Instructions
If only registering for a class, select any method of shipment to proceed, as shipping charges will not apply.

If ordering products in addition to registration, select desired shipping method.

Regular Tuition Registration: $995.00 Materials Ultramicrotomy Course

Pay by Check

Make payable to EMS and reference "X-Ray Microanalysis Workshop".

Return your registration to:
Stacie Kirsch
1560 Industry Road
Hatfield, PA 19440 USA

Please contact Stacie Kirsch for more information.
Phone: 215-412-8400 Fax: 215-412-8450
E-Mail: stacie@ems-secure.com