Available for SEM and LM
This Test Specimen is made of a 5mmx5mm square of single crystal silicon. It is photo-etched and the squares repeat every 10µm. The dividing lines are 1.9µm wide.
A broader etching line is written every 500µm, which is useful in light microscopy. This is an excellent test specimen for comparing magnification and assessing any distortion in the image field. It is ideally useful in the context of automated counting systems to check for unsuspected distortions. Where critical measurements must be made the sample can be mounted directly onto the calibration specimen so that an internal calibration is obtained on the micro-graph.
|79502-01||Silicon Test Specimen, Unmounted||each||80.00||Add to Cart|
|79502-10||Silicon Test Specimen, Unmounted||10/pk||785.00||Add to Cart|
|79502-12||Silicon Test Specimen on 12.5mm Pin Stub||each||99.00||Add to Cart|
|79502-20||Silicon Test Specimen for Incident LM||each||156.00||Add to Cart|
|79502-30||Calibration Certificate||each||317.00||Add to Cart|